Comparison of charge trapping in undoped oxides made by low- and high-temperature deposition techniques

✍ Scribed by Mrstik, B.J.; Hughes, H.L.; Lawrence, R.K.; McMarr, P.J.; Gouker, P.

• Book ID: 115470843
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 113 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.983180