Comparison of Bi2Sr2CaCu2O8surfaces cleaved at low temperature and at room temperature from secondary ion mass spectrometry and work function measurements

✍ Scribed by Saito, S. ;Uhara, Y. ;Kogushi, Y. ;Yoshida, H. ;Isono, S. ;Yamasaki, H. ;Murakami, H. ;Sutou, T. ;Soumura, T. ;Kioka, T.

• Book ID: 105363375
• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 166 KB
• Volume: 202
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.200521169

✦ Synopsis

Abstract

Secondary ion mass spectrometry (SIMS) and work function measurements were made to examine the surface composition difference between Bi~2~Sr~2~CaCu~2~O~8~ surfaces that were cleaved at low temperature and at room temperature. SIMS measurements of the surfaces cleaved at room temperature indicated that the intensity of secondary ions Ca^+^, Sr^+^, and Cu^+^ increases and the intensity of O^–^ decreases with time. More‐ over, the work function increased with time. On the other hand, SIMS of the surfaces cleaved at low temperature indicated comparatively much smaller changes in intensity of secondary ion spectra and work function. These findings are discussed in terms of the decrease in surface oxygen content, and the effectiveness of the cleavage at low temperature is clarified. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)