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Comparison of beam quality parameters computed from mammographic x-ray spectra measured with different high-resolution semiconductor detectors

✍ Scribed by Tomal, A.; Cunha, D.M.; Poletti, M.E.


Book ID
123059492
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
226 KB
Volume
95
Category
Article
ISSN
0969-806X

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