✦ LIBER ✦
Comparison between TCAD simulated and measured carrier lifetimes in CMOS photodiodes using the Open Circuit Voltage Decay method
✍ Scribed by Marcelot, O.; Magnan, P.
- Book ID
- 122862511
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 549 KB
- Volume
- 81
- Category
- Article
- ISSN
- 0038-1101
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