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Comparison between microscopical aspects of a-Si films crystallized by pulsed UV excimer laser and calculated temperature profiles

✍ Scribed by J.G. Maillou; E.L. Mathé; J.C. Desoyer; S. de Unamuno; E. Fogarassy


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
857 KB
Volume
43
Category
Article
ISSN
0169-4332

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