✦ LIBER ✦
Comparison between gallium-implanted layers of ZnSe and ZnSxSe1−x by optical, electrical and electron beam characterization methods
✍ Scribed by G. Gleitsmann; N. Ammann; J. Hermans; A. Schneider; J. Geurts; P. Karduck; M. Heuken
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 494 KB
- Volume
- 138
- Category
- Article
- ISSN
- 0022-0248
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