Comparison and implications of charge collection measurements in silicon and InGaAs irradiated by energetic protons and neutrons

✍ Scribed by Normand, E.; Oberg, D.L.; Wert, J.L.; Majewski, P.P.; Woffinden, G.A.; Satoh, S.; Sasaki, K.; Tverskoy, M.G.; Miroshkin, V.V.; Goleminov, N.; Wender, S.A.; Gavron, A.

• Book ID: 120735093
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 926 KB
• Volume: 42
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.488784