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Comparator-based measurement scheme for dark-count rates in single photon avalanche diodes

✍ Scribed by Morath, C.P.; Vaccaro, K.; Buchwald, W.; Clark, W.R.

Book ID: 114629964
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 460 KB
Volume: 54
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2005.853347

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