✦ LIBER ✦
Comparative study of ion track profiles in amorphous SiO2 by TEM and AFM observations
✍ Scribed by G. Saint Martin; O.A. Bernaola; G. García Bermúdez
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 154 KB
- Volume
- 245
- Category
- Article
- ISSN
- 0168-583X
No coin nor oath required. For personal study only.
✦ Synopsis
The extension and shape of damaged material produced by ion projectiles can be analyzed in single track profiles, obtained in samples prepared using the folding track replica technique and observed by transmission electron microscopy. Until now, this technique has been mainly applied to organic materials. In the present work, the technique is used to evaluate single track profiles in amorphous SiO 2 and the results are compared with those obtained by AFM tapping mode observations.