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Comparative investigation of optical and structural properties of porous SiC

✍ Scribed by M.M. Rodriguez; J.M. Rivas; A.D. Cano; T.V. Torchynska; J.P. Gomez; G.G. Gasga; S.J. Sandoval; M. Mynbaeva

Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
838 KB
Volume
39
Category
Article
ISSN
0026-2692

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## Abstract The structural and optical properties of porous silicon (PS) layers prepared by Vapour‐Etching (VE) of moderately and heavily boron‐doped Si substrates are investigated. The VE technique produces rough PS layers that are essentially formed of interconnected cluster‐like structures. Opti