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Compactness evaluation of amorphous and nanocrystaline thin films by FT-IR reflection–absorption spectroscopy

✍ Scribed by Franc Švegl

Book ID: 116668112
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 434 KB
Volume: 345-346
Category: Article
ISSN: 0022-3093
DOI: 10.1016/j.jnoncrysol.2004.08.060

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