๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Compact scanning-force microscope using a laser diode

โœ Scribed by Sarid, Dror; Iams, Doug; Weissenberger, Volker; Bell, L. Stephen


Book ID
115417204
Publisher
Optical Society of America
Year
1988
Tongue
English
Weight
340 KB
Volume
13
Category
Article
ISSN
0146-9592

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


A compact scanning tunneling microscope
โœ P. Dietz; K.-H. Herrmann ๐Ÿ“‚ Article ๐Ÿ“… 1988 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 586 KB
A metrological scanning force microscope
โœ Y. Xu; S.T. Smith; P.D. Atherton ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 858 KB
3D Calibration of a Scanning Force Micro
โœ Bienias, M.; Gao, S.; Hasche, K.; Seemann, R.; Thiele, K. ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 521 KB

A commercial metrological scanning force microscope (SFM) has been modiรed to further improve its metrological performance and calibration. For this purpose, a three-dimensional (3D) measuring system consisting of three miniature laser interferometers has been incorporated into the SFM. Special att