Compact modeling of a flash memory cell including substrate-bias-dependent hot-electron gate current

✍ Scribed by Sonoda, K.; Tanizawa, M.; Shimizu, S.; Araki, Y.; Kawai, S.; Ogura, T.; Kobayashi, S.; Ishikawa, K.; Eimori, T.; Inoue, Y.; Ohji, Y.; Kotani, N.

• Book ID: 114617566
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 346 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2004.834915