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Compact 3-D on-wafer radiation pattern measurement system for 60 GHz antennas

✍ Scribed by Sylvain Ranvier; Mikko Kyrö; Clemens Icheln; Cyril Luxey; Robert Staraj; Pertti Vainikainen


Book ID
102519956
Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
443 KB
Volume
51
Category
Article
ISSN
0895-2477

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✦ Synopsis


Abstract

This article presents a quasi full 3‐D on‐wafer radiation pattern measurement system for 60 GHz antennas. The measurement of an omnidirectional antenna is reported and shows promising results. The radiation of the probe itself as well as the effects of a connector feeding the antenna are also studied. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 319–324, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24034