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[Communications in Computer and Information Science] Trends in Network and Communications Volume 197 || Effect of Temperature and Gate Stack on the Linearity and Analog Performance of Double Gate Tunnel FET

✍ Scribed by Wyld, David C.; Wozniak, Michal; Chaki, Nabendu; Meghanathan, Natarajan; Nagamalai, Dhinaharan

Book ID: 124149494
Publisher: Springer Berlin Heidelberg
Year: 2011
Weight: 486 KB
Category: Article
ISBN: 3642225438
DOI: 10.1007/978-3-642-22543-7_47

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