Common-cause failure analysis of a three-state device system : Balbir S. Dhillon, A. Sambhi and M. R. Khan. Microelectron. Reliab.19, 345 (1979)

• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 268 KB
• Volume: 20
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(80)90078-5