Comments on "Depletion approximation analysis of the differential capacitance-voltage characteristics of an MOS structure with nonuniformly doped semiconductors"

✍ Scribed by O'Brien, R.R.

• Book ID: 114593531
• Publisher: IEEE
• Year: 1980
• Tongue: English
• Weight: 207 KB
• Volume: 27
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1980.20117