Comments on "A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters" [with reply]

✍ Scribed by Pospieszalski, M.W.; Martines, G.; Sannino, M.

• Book ID: 114552080
• Publisher: IEEE
• Year: 1988
• Tongue: English
• Weight: 332 KB
• Volume: 36
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/22.3503