Comments on "A device model for buried-channel CCD's and MOSFET's with Gaussian impurity profiles

✍ Scribed by Wu, D.S.

• Book ID: 114593571
• Publisher: IEEE
• Year: 1980
• Tongue: English
• Weight: 202 KB
• Volume: 27
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1980.20171