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Comment on “Memory Effect and Negative Differential Resistance by Electrode-Induced Two-Dimensional Single-Electron Tunneling in Molecular and Organic Electronic Devices”

✍ Scribed by H. S. Majumdar; J. K. Baral; A. Laiho; J. Ruokolainen; O. Ikkala; R. Österbacka


Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
211 KB
Volume
18
Category
Article
ISSN
0935-9648

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P.R. China) [\*\*] The authors wish to acknowledge the support from the Natural Science and Engineering Research Council of Canada, and the Emerging Materials Knowledge Network of Materials and Manufacturing of Ontario. Thanks are also due to Sandra Gardner and Hany Aziz of the Xerox Research Center