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Combining imaging ellipsometry and grazing incidence small angle X-ray scattering for in situ characterization of polymer nanostructures

✍ Scribed by Volker Körstgens; Johannes Wiedersich; Robert Meier; Jan Perlich; Stephan V. Roth; Rainer Gehrke; Peter Müller-Buschbaum

Book ID
105892566
Publisher
Springer
Year
2009
Tongue
English
Weight
557 KB
Volume
396
Category
Article
ISSN
1618-2650

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