Combining FDTD simulations with measurements of microstrip ring resonators for characterization of low- and high-K dielectrics at microwaves
✍ Scribed by Elena Semouchkina; Wenwu Cao; Michael Lanagan; Raj Mittra; Wenhua Yu
- Publisher
- John Wiley and Sons
- Year
- 2001
- Tongue
- English
- Weight
- 184 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0895-2477
- DOI
- 10.1002/mop.1071
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✦ Synopsis
Abstract
This paper shows how the dielectric constant of alumina and rutile substrates at microwave frequencies can be accurately determined by fitting the simulated S‐parameter spectra of microstrip ring resonators, generated via the finite‐difference time‐domain (FDTD) method, to experimentally measured data. The proposed method does not require the determination of the effective dielectric constant and the approximate closed‐form expressions to find the true permittivity of the substrate. This is essential for the characterization of high‐K dielectric materials at high frequencies when the closed‐form expressions are invalid. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 29: 21–24, 2001.