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Combined XPS and ToF-SIMS study of miscible polymer blend surfaces: polystyrene/poly(2,6-dimethyl-1,4-phenylene oxide) (PS/PDMPO)

✍ Scribed by Vanden Eynde, X.; Bertrand, P.


Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
281 KB
Volume
27
Category
Article
ISSN
0142-2421

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✦ Synopsis


The inÑuence of polystyrene concentration in polystyrene and poly(2,6-dimethyl-1,4-phenylene oxide) (PS/PDMPO) miscible polymer blends has been studied by the combined techniques of x-ray photoelectron spectroscopy (XPS) and time-of-Ñight secondary ion mass spectrometry (ToF-SIMS). The O 1s/C 1s ratio in XPS and the peak intensities of characteristic fragments in ToF-SIMS are found to be linearly dependent on bulk concentrations. Angle-resolved x-ray photoelectron spectroscopy measurement does not show any concentration proÐle from the surface to the bulk. Both techniques conÐrm that the polymer surface concentrations are directly related to the bulk concentrations. Possible explanations for this absence of segregation are discussed.


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