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Combined TOF-MS/RBS analysis of LiF thin films bombarded by MeV nitrogen ions

✍ Scribed by J.A.M. Pereira; E.F. da Silveira


Book ID
114169833
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
424 KB
Volume
136-138
Category
Article
ISSN
0168-583X

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