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Combined HRTEM, X-ray microchemical and EELS fine structure analysis of planar defects in YBa2Cu3O7−δ

✍ Scribed by V.P. Dravid; Hong Zhang; L.D. Marks; J.P. Zhang

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 663 KB
Volume: 192
Category: Article
ISSN: 0921-4534
DOI: 10.1016/0921-4534(92)90739-y

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