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Combined AES, LEED, SEM and TEM characterizations of Cu−Si(100) interfaces

✍ Scribed by M. Hanbücken; J.J. Métois; P. Mathiez; F. Salvan


Publisher
Elsevier Science
Year
1985
Weight
47 KB
Volume
162
Category
Article
ISSN
0167-2584

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