𝔖 Bobbio Scriptorium
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Combination of scene-based and stochastic measurement for wide-field aberration correction in microscopic imaging

✍ Scribed by Warber, Michael ;Maier, Selim ;Haist, Tobias ;Osten, Wolfgang


Book ID
115355372
Publisher
The Optical Society
Year
2010
Tongue
English
Weight
624 KB
Volume
49
Category
Article
ISSN
1559-128X

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