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Combination of RBS analysis and infrared vibrational spectroscopy for the characterization of semiconducting ?-FeSi2 films

✍ Scribed by D�scher, Michael ;Oertel, G�nter ;Reinsperger, Gerd -Uwe ;Selle, Burkhardt ;Sieber, Ina ;Troppenz, Ute

Publisher: Springer-Verlag
Year: 1997
Weight: 376 KB
Volume: 125
Category: Article
ISSN: 0344-838X
DOI: 10.1007/bf01246193

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