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Combination of emission channeling, photoluminescence and Mössbauer spectroscopy to identify rare earth defect complexes in semiconductors

✍ Scribed by M. Dalmer; U. Vetter; M. Restle; A. Stötzler; H. Hofsäss; C. Ronning; M.K. Moodley; K. Bharuth-Ram; the ISOLDE-Collaboration


Book ID
110355498
Publisher
Springer
Year
1999
Tongue
English
Weight
69 KB
Volume
120/121
Category
Article
ISSN
0304-3843

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