The titles of the 6 chapters (148 pages) in this part are like a check-list of concerns: nonlinearity, List (Special until June 1, 1998-$120) directional and positional effects, spectral scattering, spectral distortion, polarization effects, and size-of-source This book is a treasure-house of information for the practicing spectroradiometrist. Although specifically written effect. Each of these effects is discussed, the measurement equation is altered to show how it is affected, and tech-to provide a comprehensive description of the concepts, devices, and procedures required for the reliable measure-niques are introduced to show how to measure the effect and determine the uncertainty involved, both for spectral ment of spectral irradiance and spectral radiance (from 100-2500 nm), this book presents material that is crucial irradiance and spectral radiance. Useful tips are scattered throughout the discussion, advantages and disadvantages to obtaining accurate measurements of any spectroradiometric quantity, and, subsequently, any quantity or effect of different setups are pointed out, and sources of materials are mentioned. Chapter 2 (Nonlinearity) discusses the calculated from spectroradiometric measurements.
The author has divided the 22 chapters of the book into use of the inverse square law, beam attenuation, and beam addition to determine the nonlinearity coefficients of the three parts, each part addressing one of the major causes of significant errors in spectroradiometry: the characteris-system. Chapter 3 explains the use of averaging spheres and reflecting and transmitting diffusers to mitigate the tics of the radiant flux itself, the characteristics of the instruments and standards used to measure this flux, and problems involved when the system responsivity depends on the direction of the incident flux and on its position the specific scheme or procedure used in the measurement process. Because the book is intended to be used as a in the entrance aperture. I found Chapters 4 (Spectral Scattering) and 5 (Spectral Distortion) particularly inter-handbook while planning and making measurements, the material presented is extensive and most of the chapters esting, although they will require careful study for thorin Parts I and II can stand alone as reference material.
ough understanding. In Chapter 4, the author starts by The topics in these chapters are arranged pedagogically showing the seriousness of the scattering problem within to cover all aspects of spectroradiometric measurements.
a monochromator and then incorporates this effect into However, realizing that assimilating information in this the measurement equation, which gives us a means of manner can be an intimidating process to any experimenquantitatively dealing with it. He describes how to evalutalist, the author has written Part III to enable the reader ate the magnitude of the problem, how to reduce it, and to get into actual measurements as soon as possible, imhow to correct for it. All this leads to a discussion of mediately after the introduction in Chapter 1, if desired.
the slit-scattering function, and deconvolution. Chapter 5 Part III works through the entire measurement plan, adtackles the issue of measuring a source whose spectral dressing all the topics of Parts I and II in an abbreviated output contains structure or curvature within the bandpass manner, and in the order and context in which they are of your monochromator. Various situations are discussed, required when performing a measurement.
including spectral lines within a continuum, different Chapter 1 is the introduction, defining and illustrating wavelength step sizes, effect of the shape of the slitthe usual terms such as spectroradiometry, spectroradioscattering function, and the means of obtaining an average metric quantities, measurement accuracy, spectral irradivalue. Chapter 6 (Polarization Effects) serves as a good ance, spectral distributions, a basic spectroradiometer, introduction to the topic, including practical examples ending with the flux responsivity of a spectroradiometer, describing how to obtain the required components of the the measurement equation, and the well-known basic polarization properties, although I must admit I have usuequation relating four quantities: the radiant quantity we ally done what the author advises: postpone dealing with wish to measure, the known same quantity for the calibrathe math until confronted with polarization problems in tion standard, and the two signals from the monochromamy measurements. Chapter 7 shows how to evaluate the tor, one for each of these two light sources. I suspect that size-of-source effect, caused by scattering in the forethis simple equation is all that is used by many of us for optics to the spectroradiometer, which causes an effect our measurements. The remainder of the book is written only when the source area is imaged into the system. to show us when this equation is no longer valid, and
Part II consists of 9 chapters (237 pages), which deal how to correct it.
with the equipment used in spectroradiometry-standards, instruments (optics, monochromators, control devices), and detectors. Chapters 8 and 9 consider the spec-