Coaxial to waveguide transitions and device under test characterization by means of inverse techniques
✍ Scribed by Antonio José Lozano-Guerrero; Juan Monzó-Cabrera; Francisco Javier Clemente-Fernández; Juan Luis Pedreño-Molina; Alejandro Díaz-Morcillo
- Publisher
- John Wiley and Sons
- Year
- 2010
- Tongue
- English
- Weight
- 372 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0895-2477
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✦ Synopsis
Abstract
A new two‐tier inverse characterization technique for coaxial to waveguide transitions including a device under test (DUT) is presented in this article.The transitions and the DUT are characterized by its scattering parameters, and a cascade procedure is used to compare calculations and measurements during the unterminating procedure. Two different standard types such as short‐circuits and thrus are used, and the two transitions jointly with the DUT are simultaneously characterized. Genetic algorithms and a gradient based method have been used for error minimization during the unterminating stage. Results of this two‐tier inverse technique are compared to those provided by measurements, simulations, and the three‐cavity method, showing that it is possible to properly characterize the coaxial to waveguide transitions and the DUT in a flexible and accurate way. © 2010 Wiley Periodicals, Inc. Microwave Opt Technol Lett 52: 1294–1297, 2010; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.25159