CMOS transistor faults and bridging faults: Testability by delay effects and overcurrents

✍ Scribed by U. Hübner; W. Meyer; H.T. Vierhaus

• Book ID: 107910454
• Publisher: Elsevier Science
• Year: 1992
• Weight: 306 KB
• Volume: 35
• Category: Article
• ISSN: 0165-6074
• DOI: 10.1016/0165-6074(92)90342-5