CMOS Test and Evaluation: A Physical Perspective

✍ Scribed by Manjul Bhushan, Mark B. Ketchen (auth.)

Publisher: Springer-Verlag New York
Year: 2015
Tongue: English
Leaves: 431
Edition: 1
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

✦ Table of Contents

Front Matter....Pages i-xiii
Introduction....Pages 1-15
CMOS Circuits Basics....Pages 17-83
CMOS Storage Elements and Synchronous Logic....Pages 85-123
IDDQ and Power....Pages 125-157
Embedded PVT Monitors....Pages 159-199
Variability....Pages 201-239
Electrical Tests and Characterization in Manufacturing....Pages 241-284
Reliability....Pages 285-310
Basic Statistics and Data Visualization....Pages 311-345
CMOS Metrics and Model Evaluation....Pages 347-398
Back Matter....Pages 399-424

✦ Subjects

Electronics and Microelectronics, Instrumentation; Circuits and Systems; Semiconductors; Quality Control, Reliability, Safety and Risk

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