๐”– Scriptorium
โœฆ   LIBER   โœฆ

๐Ÿ“

CMOS RF Circuit Design for Reliability and Variability

โœ Scribed by Jiann-Shiun Yuan (auth.)


Publisher
Springer Singapore
Year
2016
Tongue
English
Leaves
108
Series
SpringerBriefs in Applied Sciences and Technology
Edition
1
Category
Library

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โœฆ Synopsis


The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

โœฆ Table of Contents


Front Matter....Pages i-vi
Introduction....Pages 1-2
CMOS Transistor Reliability and Variability Mechanisms....Pages 3-9
Low-Noise Amplifier Reliability....Pages 11-18
Power Amplifier Reliability....Pages 19-31
Voltage-Controlled Oscillator Reliability....Pages 33-48
Mixer Reliability....Pages 49-53
LNA Design for Variability....Pages 55-69
Power Amplifier Design for Variability....Pages 71-88
Oscillator Design for Variability....Pages 89-97
Mixer Design for Variability....Pages 99-106

โœฆ Subjects


Circuits and Systems; Electronic Circuits and Devices; Microwaves, RF and Optical Engineering


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