Classified index to articles-Vols. 14 &
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Article
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1984
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Elsevier Science
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English
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FL speed improvements by an ion implantation modification to a standard bipolar p#ocess 14 -2 Consequences of contact resistance in very-small-geometry CML gates 14 5 Parasitic MOSFETs in one oxide-isolated bipolar technology: process-control measurements 15 1