✦ LIBER ✦
Classification of macroscopic defects contained in p-type EFG ribbon silicon: C. T. Ho, D. B. Sandstrom and C. E. Dube. Solid-St. Electron.29(5), 495 (1986)
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 129 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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