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Classification of flaws in ultrasonic and X-ray testing

✍ Scribed by V. M. Zuev; V. I. Ivanov; V. I. Kapustin

Book ID: 110209902
Publisher: SP MAIK Nauka/Interperiodica
Year: 2006
Tongue: English
Weight: 207 KB
Volume: 42
Category: Article
ISSN: 1061-8309
DOI: 10.1134/s1061830906050068

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