Circuit structures for high-digit-rate bit error ratio measurements: J J O'Reilly (Sch. of Electron. Eng. Sci. Univ. Coll. of North Wales, Bangor, Wales), I Rampaigul IEE Proc. F (GB), vol. 134, no. 5, pp. 434–438 (Aug. 1987)

• Book ID: 104157691
• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 98 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(88)80152-6