Circuit analysis, logic simulation and design verification for VLSI : Albert E. Ruehli and Gary S. Ditlow. Proc. IEEE71 (1), 34 (1983)

Circuit analysis, logic simulation and d

Circuit analysis, logic simulation and design verfication for VLSI: Alberte. Ruehi and Garys. Ditlow Proc. IEEE 71 (1(, 34 (1983)

📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 102 KB

The use of high om.~gnetic fields for the characterization of impurities in epitaxiai GaAs M. N AFSAR Microelectron. J. 13 (1), 15 (1982) The only reliable method for indentification of donor contaminants such as Si, S, Si, Sn and Ge in ultra-high purity epitaxial GaAs is the observation of the 1 s