Choosing Between Terminal and Independently Based Gain and Offset Error in the ADC Histogram Test

✍ Scribed by Alegria, F.C.; da Silva, H.P.

• Book ID: 114632254
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 496 KB
• Volume: 61
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2011.2161014