Chip verification of 4 Mbit DRAMs by E-Beam testing

✍ Scribed by Jochen Kölzer; Mike Killian; Klaus Althoff; Fergal Bonner; Siegfried Görlich; Johann Otto; Wilhelm Argyo; Fred Fox; Heinrich Hemmert; Diether Sommer

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 665 KB
• Volume: 12
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(90)90012-i