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Chip Form Monitoring through Advanced Processing of Cutting Force Sensor Signals

✍ Scribed by R. Teti; I.S. Jawahir; K. Jemielniak; T. Segreto; S. Chen; J. Kossakowska


Publisher
International Academy for Production Engineering
Year
2006
Tongue
English
Weight
627 KB
Volume
55
Category
Article
ISSN
0007-8506

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✦ Synopsis


This paper draws on the activities of the CIRP Collaborative Work on "Round Robin on Chip Form Monitoring" carried out within the Scientific-Technical Committee Cutting (STC-C). This collaborative work involved the following main round robin activities: (a) generation, detection, storage and exchange of cutting force sensor signals obtained at different Laboratories during sensor-based monitoring of machining processes with variable cutting conditions yielding diverse chip forms, and (b) cutting force signal (CFS) characterization and feature extraction through advanced processing methodologies, both aimed at comparing chip form monitoring results achieved on the basis of innovative analysis paradigms.