ChemInform Abstract: X-Ray High-Resolution Diffractometry for Studies of Diffuse Scattering in Semiconductor Materials

✍ Scribed by J. Gronkowski; J. Borowski

• Publisher: John Wiley and Sons
• Year: 2010
• Weight: 24 KB
• Volume: 32
• Category: Article
• ISSN: 0931-7597
• DOI: 10.1002/chin.200152227