ChemInform Abstract: The Scanning Microscope for Semiconductor Characterization: Photocurrent, Photovoltage and Electrolyte Electroreflectance Imaging at the n-MoSe2/I- Interface.

✍ Scribed by A. M. CHAPARRO; P. SALVADOR; A. MIR

• Publisher: John Wiley and Sons
• Year: 2010
• Weight: 27 KB
• Volume: 28
• Category: Article
• ISSN: 0931-7597
• DOI: 10.1002/chin.199738012