✦ LIBER ✦
ChemInform Abstract: Surface and Interface Roughness of Ultrathin Nitric Oxide Oxynitride Gate Dielectric.
✍ Scribed by R. I. HEGDE; B. MAITI; R. S. RAI; K. G. REID; P. J. TOBIN
- Publisher
- John Wiley and Sons
- Year
- 2010
- Weight
- 36 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0931-7597
No coin nor oath required. For personal study only.