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ChemInform Abstract: Single-Electron-Spin Measurements in Si-Based Semiconductor Nanostructures

โœ Scribed by H. W. Jiang; E. Yablonovitch; M. Xiao; M. Sakr; G. Scott; E. T. Croke


Publisher
John Wiley and Sons
Year
2010
Weight
15 KB
Volume
41
Category
Article
ISSN
0931-7597

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