𝔖 Bobbio Scriptorium
✦   LIBER   ✦

ChemInform Abstract: Preparation and Photoelectron Spectroscopy Study of UNx Thin Films.

✍ Scribed by L. Black; F. Miserque; T. Gouder; L. Havela; J. Rebizant; F. Wastin

Publisher
John Wiley and Sons
Year
2001
Weight
35 KB
Volume
32
Category
Article
ISSN
0931-7597

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

X-ray Photoelectron Spectroscopy Depth P
X-ray Photoelectron Spectroscopy Depth Profiling of Aluminium Nitride Thin Films
✍ Butcher, K. S. A.; Tansley, T. L.; Li, Xin 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 359 KB 👁 2 views

Aluminium nitride thin Ðlms grown at room temperature on degenerate silicon (conducting) substrates have been studied using XPS. The hydrolysis layer at the surface of the AlN was examined using valence band measurements, and the e †ect of 5 kV argon ion milling used to remove the hydrolysis layer w

Hardening Process and Surface Structure
Hardening Process and Surface Structure of Lacquer Films Studied byX-ray Photoelectron Spectroscopy
✍ Niimura, Noriyasu; Iijima, Yoshitoki; Miyakoshi, Tetsuo 📂 Article 📅 1996 🏛 John Wiley and Sons 🌐 English ⚖ 456 KB 👁 2 views

The changes of the composition ratios and chemical binding states of the component elements in the surfaces of four varieties of lacquer films during the hardening process were studied by x-ray photoelectron spectroscopy (XPS). Additionally, the relationship between the surface structure and hardeni