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ChemInform Abstract: Paramagnetic Defects in Porous Silicon

✍ Scribed by H. J. VON BARDELEBEN; J. L. CANTIN


Publisher
John Wiley and Sons
Year
2010
Weight
23 KB
Volume
29
Category
Article
ISSN
0931-7597

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We describe the defect properties in nitrogen plasma treated porous silicon (PS) studied using electron paramagnetic resonance (EPR). We consider the dependence of the paramagnetic properties of the defects on the structure of PS. The nitrogen plasma treatment changed the structure of PS. After the