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ChemInform Abstract: On the Advantages of the Use of the Three-Element Detector System for Measuring EDXRD Patterns to Follow the Crystallization of Open-Framework Structures.

✍ Scribed by Gavin Muncaster; Andrew T. Davies; Gopinathan Sankar; C. Richard A. Catlow; John Meurig Thomas; Sally L. Colston; Paul Barnes; Richard I. Walton; Dermot O'Hare


Publisher
John Wiley and Sons
Year
2001
Weight
29 KB
Volume
32
Category
Article
ISSN
0931-7597

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