✦ LIBER ✦
ChemInform Abstract: On the Advantages of the Use of the Three-Element Detector System for Measuring EDXRD Patterns to Follow the Crystallization of Open-Framework Structures.
✍ Scribed by Gavin Muncaster; Andrew T. Davies; Gopinathan Sankar; C. Richard A. Catlow; John Meurig Thomas; Sally L. Colston; Paul Barnes; Richard I. Walton; Dermot O'Hare
- Publisher
- John Wiley and Sons
- Year
- 2001
- Weight
- 29 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0931-7597
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