ChemInform Abstract: New Reference Standards and Artifacts for Nanoscale Physical Property Characterization

✍ Scribed by Jon R. Pratt; John A. Kramar; Gordon Shaw; Richard Gates; Paul Rice; John Moreland

• Publisher: John Wiley and Sons
• Year: 2008
• Weight: 15 KB
• Volume: 39
• Category: Article
• ISSN: 0931-7597
• DOI: 10.1002/chin.200804262